Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks (Q6049270)
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scientific article; zbMATH DE number 7750624
Language | Label | Description | Also known as |
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English | Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks |
scientific article; zbMATH DE number 7750624 |
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Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks (English)
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17 October 2023
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one-shot devices
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reliability
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Monte Carlo simulation study
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robustness
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competing risks
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