The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing (Q3401367)
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scientific article; zbMATH DE number 5664610
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| English | The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing |
scientific article; zbMATH DE number 5664610 |
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The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing (English)
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29 January 2010
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high reliability
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failure rate
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life time
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Bayesian approach
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prior distributions
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exponential distributions
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Markov chain Monte Carlo method
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Metropolis-Hasting's alrogithm
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posterior distributions
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censoring
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0.7194115519523621
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0.7151831984519958
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0.7151831984519958
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