The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing (Q3401367)

From MaRDI portal
scientific article
Language Label Description Also known as
English
The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
scientific article

    Statements

    The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing (English)
    0 references
    29 January 2010
    0 references
    high reliability
    0 references
    failure rate
    0 references
    life time
    0 references
    Bayesian approach
    0 references
    prior distributions
    0 references
    exponential distributions
    0 references
    Markov chain Monte Carlo method
    0 references
    Metropolis-Hasting's alrogithm
    0 references
    posterior distributions
    0 references
    censoring
    0 references

    Identifiers

    0 references
    0 references
    0 references
    0 references
    0 references
    0 references