Publication:4239708
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DOI<169::AID-NAV3>3.0.CO;2-U 10.1002/(SICI)1520-6750(199903)46:2<169::AID-NAV3>3.0.CO;2-UzbMath0918.90079MaRDI QIDQ4239708
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Publication date: 4 August 1999
62P30: Applications of statistics in engineering and industry; control charts
90B25: Reliability, availability, maintenance, inspection in operations research
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Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals, Optimum plan for step-stress model with progressive type-II censoring, Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model, Interval estimation for exponential progressive type-II censored step-stress accelerated life-testing, Unbiased estimations for the exponential distribution based on step-stress accelerated life-testing data, Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution, Design of Bivariate Accelerated Life Tests with One Main Effect and One Interaction Effect for Log-Location-Scale Distributions
Cites Work
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- Optimum Simple Step-Stress Plans for Accelerated Life Testing
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Optimum simple step-stress accelerated life-tests with competing causes of failure
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
- Some Theorems Relevant to Life Testing from an Exponential Distribution
