Accelerated life test sampling plans for exponential distributions

DOI10.1080/03610919408813154MaRDI QIDQ4844125zbMATH OpenOpenAlexFDO

Authors Hui K. Hsieh

Publication date 20 August 1995

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610919408813154

zbMATH Keywords

algorithmGaussian quadraturemaximum likelihood estimateproducer's and consumer's risksstress leveltype II censoring

Mathematics Subject Classification ID

Statistics (62-XX)

Recommendations

• Planning accelerated life tests for censored two-parameter exponential distributions
• Planning accelerated life tests with type II censored data
• Planning step-stress accelerated life tests with two experimental factors for exponential distributions and type I censoring
• Optimal design of accelerated life tests under periodic inspection
• Failure–censored reliability sampling plans for the exponential distribution

Cites work

• Accelerated Testing

Cited in

(8)

• Design of accelerated life test sampling plans with a nonconstant shape parameter
• Accuracy of approximate progressively censored reliability sampling plans for exponential models
• Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring
• scientific article; zbMATH DE number 4151684 (Why is no real title available?)
• Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals
• Planning accelerated life tests for censored two-parameter exponential distributions
• Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring
• Quality control via accelerated data with exponential distribution and power law stress-response relationship

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