Optimum Simple Step-Stress Plans for Accelerated Life Testing
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(78)- Optimum M-step, step-stress design with K stress variables
- Planning step-stress test plans under type-I censoring for the log-location-scale case
- Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme
- The step-stress tampered failure rate model under interval monitoring
- Optimal design of accelerated life testing plans for periodical replacement with penalty
- Optimal design of multiple constant-stress accelerated life testing for the extension of the exponential distribution under type-II censoring
- Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution
- Bayesian order-restricted inference of a Weibull multi-step step-stress model
- Estimation for Birnbaum-Saunders distribution in simple step stress-accelerated life test with type-II censoring
- Meta-analysis of general step-stress experiments under repeated type-II censoring
- Analysis of simple step-stress accelerated life test data from Lindley distribution under type-I censoring
- Step stress model with threshold parameter
- Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under type-II censoring
- Optimal step-stress test under type-I censoring for multivariate exponential distribution
- Optimal allocation of change points in simple step-stress experiments under type-II censoring
- On the optimal constant-stress acceleration based on competing risks with progressive type-II censoring for Lindley distribution
- Analysis and optimum plan for 3-step step-stress accelerated life tests with Lomax model under progressive type-I censoring
- Inferences in constant-partially accelerated life tests based on progressive type-II censoring
- Optimal design of accelerated life tests under modified stress loading methods
- A semiparametric approach for simple step-stress model
- Expected termination times of progressively Type‐I censored step‐stress accelerated life tests under continuous and interval inspections
- Optimal robust designs of step-stress accelerated life testing experiments for proportional hazards models
- A sequential order statistics approach to step-stress testing
- Optimal step-stress testing for progressively type-I censored data from exponential distribu\-tion
- Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint
- Exponential progressive step-stress life-testing with link function based on Box-Cox transfor\-mation
- Exact inference for a simple step-stress model from the exponential distribution under time constraint
- Planning accelerated life tests for censored two-parameter exponential distributions
- Step partially accelerated life tests under finite mixture models
- Estimating the Pareto parameters under progressive censoring data for constant-partially accelerated life tests
- Designing Bayesian sampling plans for simple step-stress of accelerated life test on censored data
- OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS
- A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests
- Exact inference for a simple step-stress model with type-II hybrid censored data from the exponential distribution
- Optimal design of multiple accelerated life testing for generalized half-normal distribution under type-I censoring
- Prediction of times to failure of censored items for a simple step-stress model with regular and progressive type I censoring from the exponential distribution
- Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes
- Analysis of simple step-stress model in presence of competing risks
- scientific article; zbMATH DE number 7608530 (Why is no real title available?)
- Equivalent accelerated life testing plans for log-location-scale distributions
- Asymptotic comparison between constant-stress testing and step-stress testing for type-I censored data from exponential distribution
- Exact inference for a simple step-stress model with generalized type-I hybrid censored data from the exponential distribution
- Optimal bivariate step-stress accelerated life test for type-I hybrid censored data
- Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
- Planning step-stress test under type-I censoring for the exponential case
- Properties of the Weibull cumulative exposure model
- A stochastic time scale based framework for system reliability under a Markovian dynamic environment
- Optimum simple step-stress plans using reliability estimate
- Inference in step-stress models based on failure rates
- Estimation in constant-stress accelerated life tests for extension of the exponential distribution under progressive censoring
- Exact inference for the parameter of the exponential distribution based on type-I censored stage life testing data
- Optimal step-stress test under type I progressive group-censoring with random removals
- Exact inference for a simple step-stress model with type-I hybrid censored data from the exponential distribution
- Parametric inference for progressive type-I hybrid censored data on a simple step-stress accelerated life test model
- Parameter estimation of the two-parameter exponential distribution under step-stress accelerated test with censoring
- Optimal simple step stress accelerated life test design for reliability prediction
- On the simple step-stress model for two-parameter exponential distribution
- A meta-analysis approach for step-stress experiments
- RETRACTED ARTICLE: Optimal planning of failure-step stress partially accelerated life tests under type-II censoring
- Estimation in step-stress accelerated life tests for the exponentiated exponential distribution with type-I censoring
- Optimal planning of progressively Type-I censored step-stress accelerated life test under interval inspection
- Equivalence of the tampered random variable and the tampered failure rate models in accelerated lifetesting for a class of life distributions having the ‘setting the clock back to zero property'
- Prediction of censored exponential lifetimes in a simple step-stress model under progressive type II censoring
- Estimation and optimal plans of multiple ramp-stress accelerated life tests for the generalized half-normal distribution
- Optimal designs for step-stress models under interval censoring
- Statistical inference based on progressively type-II censored data from the Burr X distribution under progressive-stress accelerated life test
- Exact likelihood-ratio tests for a simple step-stress cumulative exposure model with censored exponential data
- Inference and optimal design based on step -- partially accelerated life tests for the generalized Pareto distribution under progressive type-I censoring
- A tampered failure rate model for step-stress accelerated life test
- Inference and optimal design of multiple constant-stress testing for generalized half-normal distribution under type-II progressive censoring
- A Parametric Model for Studying Organism Fitness Using Step-Stress Experiments
- Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions
- Maximum precision estimation for a step-stress model using two-stage methodologies
- Reference optimality criterion for planning accelerated life testing
- Optimal designs for LED degradation modeling
- Design of bivariate accelerated life tests with one main effect and one interaction effect for log-location-scale distributions
- Optimal multiple constant-stress accelerated life tests for generalized exponential distribution
- Estimation of Lindley constant-stress model via product of spacing with Type-II censored accelerated life data
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