Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model

DOI10.1016/j.csda.2009.01.008zbMath1453.62235OpenAlexW2014504384MaRDI QIDQ961696

Bing Xing Wang

Publication date: 1 April 2010

Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.csda.2009.01.008

Mathematics Subject Classification ID

Computational methods for problems pertaining to statistics (62-08) Reliability and life testing (62N05)

Related Items (3)

The prediction intervals of remaining useful life based on constant stress accelerated life test data ⋮ Optimal allocation of change points in simple step-stress experiments under type-II censoring ⋮ The step-stress tampered failure rate model under interval monitoring

Cites Work

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• Conditions for the coincidence of the TFR, TRV and CE models
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• Optimum simple step-stress accelerated life tests with censoring
• A tampered failure rate model for step-stress accelerated life test
• Bayesian estimation and optimal designs in partially accelerated life testing
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Accelerated Testing
• Planning accelerated life tests for censored two-parameter exponential distributions
• Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model
• Goodness-of-fit test for the exponential distribution based on progressively Type-II censored sample

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