Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model
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Publication:961696
DOI10.1016/J.CSDA.2009.01.008zbMATH Open1453.62235OpenAlexW2014504384MaRDI QIDQ961696FDOQ961696
Authors: Bingxing Wang
Publication date: 1 April 2010
Published in: Computational Statistics and Data Analysis (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.csda.2009.01.008
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Cites Work
- Recent and classical tests for exponentiality: a partial review with comparisons
- Title not available (Why is that?)
- Bayesian estimation and optimal designs in partially accelerated life testing
- Accelerated Testing
- A tampered failure rate model for step-stress accelerated life test
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Optimum simple step-stress accelerated life tests with censoring
- Unbiased estimations for the exponential distribution based on step-stress accelerated life-testing data
- Goodness-of-fit test for the exponential distribution based on progressively Type-II censored sample
- A general Bayes exponential inference model for accelerated life testing
- Planning accelerated life tests for censored two-parameter exponential distributions
- Conditions for the coincidence of the TFR, TRV and CE models
- Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model
Cited In (7)
- Scale tests for a multilevel step-stress model with exponential lifetimes under type-II censoring
- The step-stress tampered failure rate model under interval monitoring
- Testing the validity of a link function assumption in repeated type-II censored general step-stress experiments
- Optimal allocation of change points in simple step-stress experiments under type-II censoring
- Models Comparison for Step-Stress Accelerated Life Testing
- The prediction intervals of remaining useful life based on constant stress accelerated life test data
- A model for step-stress accelerated life testing
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