Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model

DOI10.1016/J.CSDA.2009.01.008MaRDI QIDQ961696zbMATH OpenOpenAlexFDO

Authors Bingxing Wang

Publication date 1 April 2010

Published in Computational Statistics and Data Analysis (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.csda.2009.01.008

Mathematics Subject Classification ID

Computational methods for problems pertaining to statistics (62-08) Reliability and life testing (62N05)

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Cites work

• scientific article; zbMATH DE number 3860238 (Why is no real title available?)
• A general Bayes exponential inference model for accelerated life testing
• A tampered failure rate model for step-stress accelerated life test
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Accelerated Testing
• Bayesian estimation and optimal designs in partially accelerated life testing
• Conditions for the coincidence of the TFR, TRV and CE models
• Goodness-of-fit test for the exponential distribution based on progressively Type-II censored sample
• Optimum simple step-stress accelerated life tests with censoring
• Planning accelerated life tests for censored two-parameter exponential distributions
• Recent and classical tests for exponentiality: a partial review with comparisons
• Unbiased estimations for the exponential distribution based on step-stress accelerated life-testing data
• Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model

Cited in

(7)

• Scale tests for a multilevel step-stress model with exponential lifetimes under type-II censoring
• The step-stress tampered failure rate model under interval monitoring
• Testing the validity of a link function assumption in repeated type-II censored general step-stress experiments
• Optimal allocation of change points in simple step-stress experiments under type-II censoring
• Models Comparison for Step-Stress Accelerated Life Testing
• The prediction intervals of remaining useful life based on constant stress accelerated life test data
• A model for step-stress accelerated life testing

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