Calibration and validation of coarse-grained models of atomic systems: application to semiconductor manufacturing (Q2512486): Difference between revisions
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Latest revision as of 03:31, 19 December 2024
scientific article
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English | Calibration and validation of coarse-grained models of atomic systems: application to semiconductor manufacturing |
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Calibration and validation of coarse-grained models of atomic systems: application to semiconductor manufacturing (English)
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7 August 2014
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Bayesian statistics
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coarse graining
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canonical ensemble
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calibration
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validation
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uncertainty quantification
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model selection
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