Monitoring high-yields processes with defects count in nonconforming items by artificial neural network (Q2371430): Difference between revisions

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Monitoring high-yields processes with defects count in nonconforming items by artificial neural network
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    Monitoring high-yields processes with defects count in nonconforming items by artificial neural network (English)
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    4 July 2007
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    high-yields processes
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    generalized Poisson model
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    statistical process control
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    artificial neural network
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