Electromigration failure of metal lines (Q2432249): Difference between revisions
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Electromigration failure of metal lines |
scientific article |
Statements
Electromigration failure of metal lines (English)
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25 October 2006
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Electromigration
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failure
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integrated circuit
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threshold current density
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