Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (Q2463340): Difference between revisions

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Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data
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    Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data (English)
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    5 December 2007
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