On the determination of dopant-concentration profiles by grazing emission X-ray fluorescence spectroscopy using the maximum-entropy method (Q1861663): Difference between revisions
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Revision as of 05:58, 5 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | On the determination of dopant-concentration profiles by grazing emission X-ray fluorescence spectroscopy using the maximum-entropy method |
scientific article |
Statements
On the determination of dopant-concentration profiles by grazing emission X-ray fluorescence spectroscopy using the maximum-entropy method (English)
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10 March 2003
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inverse Laplace transform
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maximum entropy
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semiconductors
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spectroscopy
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X-ray fluorescence
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