The minimal log discrepancies on a smooth surface in positive characteristic (Q2223512): Difference between revisions
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Revision as of 06:21, 5 March 2024
scientific article
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English | The minimal log discrepancies on a smooth surface in positive characteristic |
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The minimal log discrepancies on a smooth surface in positive characteristic (English)
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29 January 2021
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Let \(k\) be an algebraically closed field of arbitrary characteristic, \((A,\mathfrak{a}^e)\) a pair, where \(A\) is a smooth surface and \(\mathfrak{a}^e = \mathfrak{a}_1^{e_1}\cdots \mathfrak{a}_s^{e_s}\) is a multi-ideal, i.e.\ \(\mathfrak{a}_i\) is a non-zero coherent ideal sheaf and \(e_i\in \mathbb{R}_{>0}\) for all \(i=1,\ldots , s\). The main goal of the paper under review is to prove a conjecture by \textit{M. Mustaţă} and \textit{Y. Nakamura} [Contemp. Math. 712, 287--306 (2018; Zbl 1397.14008)] for pairs \((A,\mathfrak{a}^e)\) in the positive characteristic case (cf.\ Theorem 1.4). As a consequence, the ACC Conjecture is proved for these pairs (cf.\ Corollary 1.6). The key ingredient in the proof of the main result of the paper is the work by \textit{M. Kawakita} [J. Algebr. Geom. 23, No. 4, 765--774 (2014; Zbl 1343.14014)], generalised by the author of the paper under review to the positive characteristic case.
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surfaces in positive characteristic
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ideal sheaves
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log discrepancies
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ACC
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