An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits (Q3904532): Difference between revisions
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Latest revision as of 14:19, 5 March 2024
scientific article
Language | Label | Description | Also known as |
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English | An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits |
scientific article |
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An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits (English)
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1981
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error correction
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stuck faults
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test generation
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untestable fault
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