An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits (Q3904532): Difference between revisions

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Latest revision as of 14:19, 5 March 2024

scientific article
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An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
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    An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits (English)
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    1981
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    error correction
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    stuck faults
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    test generation
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    untestable fault
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