Simultaneous measurement of local film thickness and temperature distribution in wavy liquid films using a luminescence technique (Q865821): Difference between revisions

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Latest revision as of 19:40, 19 March 2024

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Simultaneous measurement of local film thickness and temperature distribution in wavy liquid films using a luminescence technique
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    Simultaneous measurement of local film thickness and temperature distribution in wavy liquid films using a luminescence technique (English)
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    20 February 2007
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    A non-invasive measuring method to determine the temperature distribution and the local film thickness in wavy liquid films simultaneously is presented in the paper. The method allows to obtain highly resolved experimental data on the temperature distribution in a heated film. This method is based on the temperature-dependent emission lifetime of an optical indicator. The temperature is determined by measuring of the phosphorence intensity in aqueous biacetyl solution. Experiments were performed on laminar-wavy liquid film flowing down the inclined and heated plane. Velocity field is approximated by a parabolic profile. The results indicate a wave-induced intensification of heat transfer due to convective transport perpendicular to wall in the central region of the film.
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    falling films
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    local heat transfer coefficient
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    effective heat flux
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