Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films (Q2383266): Difference between revisions

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Revision as of 01:35, 20 March 2024

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Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films
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    Position-thickness-dependent stresses and stress-induced diffuse dielectric anomaly in perovskite ferroelectric films (English)
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    8 October 2007
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    Ferroelectric
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    thin film
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    stress
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    grain size
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    permittivity
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