An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (Q2228702): Difference between revisions
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Revision as of 03:05, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors |
scientific article |
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An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (English)
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19 February 2021
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MOSFETs
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threshold voltage extraction
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DIBL effects
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WENO procedure
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