Monitoring high-yields processes with defects count in nonconforming items by artificial neural network (Q2371430): Difference between revisions
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Latest revision as of 11:08, 26 June 2024
scientific article
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English | Monitoring high-yields processes with defects count in nonconforming items by artificial neural network |
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Monitoring high-yields processes with defects count in nonconforming items by artificial neural network (English)
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4 July 2007
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high-yields processes
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generalized Poisson model
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statistical process control
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artificial neural network
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