Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (Q833941): Difference between revisions
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| Property / cites work: Dependence of stress on elastic constants in an anisotropic bimaterial under plane deformation; and the interfacial crack / rank | |||
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| Property / cites work: Thin Film Materials / rank | |||
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| Property / cites work: Mixed Mode Cracking in Layered Materials / rank | |||
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| Property / cites work: Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. I: Mathematical formulation / rank | |||
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| Property / cites work: Generalized Dundurs constants for anisotropic bimaterials / rank | |||
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Latest revision as of 20:53, 1 July 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system |
scientific article |
Statements
Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (English)
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14 August 2009
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epitaxial film/substrate system
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anisotropic elasticity
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channeling crack
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periodic array of channeling cracks
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critical condition for crack formation
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