Defect rate evaluation via simple active learning (Q740115): Difference between revisions

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Revision as of 09:18, 12 July 2024

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Defect rate evaluation via simple active learning
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    Defect rate evaluation via simple active learning (English)
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    12 August 2016
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    importance sampling
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    nonlinear classification
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    optimal design
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    random sampling
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    rare event
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    support vector machine
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