Defect rate evaluation via simple active learning

DOI10.1186/s40736-015-0019-zzbMath1383.62355OpenAlexW2243485481WikidataQ59404613 ScholiaQ59404613MaRDI QIDQ740115

Yoshiyuki Ninomiya, Yuta Umezu, Hiroshi Ikeda, Hidetoshi Matsuoka

Publication date: 12 August 2016

Published in: Pacific Journal of Mathematics for Industry (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1186/s40736-015-0019-z

zbMATH Keywords

importance samplingrandom samplingoptimal designsupport vector machinenonlinear classificationrare event

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Optimal statistical designs (62K05) Applications of statistics in engineering and industry; control charts (62P30) Sampling theory, sample surveys (62D05) Learning and adaptive systems in artificial intelligence (68T05)

Cites Work

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• 10.1162/153244302760185243
• Optimum Designs in Regression Problems
• Optimum Designs in Regression Problems, II