Influence of the analysis window on the metrological performance of the grid method (Q333624): Difference between revisions
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| Property / cites work: On biases in displacement estimation for image registration, with a focus on photomechanics / rank | |||
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| Property / cites work: Towards deconvolution to enhance the grid method for in-plane strain measurement / rank | |||
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Revision as of 19:48, 12 July 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Influence of the analysis window on the metrological performance of the grid method |
scientific article |
Statements
Influence of the analysis window on the metrological performance of the grid method (English)
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31 October 2016
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image-based contactless measurement
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displacement and strain maps
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grid method
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windowed Fourier analysis
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spatially correlated noise
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derivative of a random process
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Wigner-ville transform
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