An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (Q2228702): Difference between revisions
From MaRDI portal
Set OpenAlex properties. |
ReferenceBot (talk | contribs) Changed an Item |
||
Property / cites work | |||
Property / cites work: Weighted ENO interpolation and applications. / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Point-value WENO multiresolution applications to stable image compression / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: A comprehensive characterization of the threshold voltage extraction in MOSFETs transistors based on smoothing splines / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Efficient implementation of weighted ENO schemes / rank | |||
Normal rank | |||
Property / cites work | |||
Property / cites work: Weighted essentially non-oscillatory schemes / rank | |||
Normal rank |
Latest revision as of 16:14, 24 July 2024
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors |
scientific article |
Statements
An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (English)
0 references
19 February 2021
0 references
MOSFETs
0 references
threshold voltage extraction
0 references
DIBL effects
0 references
WENO procedure
0 references