Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements (Q1795348): Difference between revisions
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Latest revision as of 10:32, 30 July 2024
scientific article
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English | Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements |
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Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements (English)
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16 October 2018
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\(k\)-valued logics function
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unreliable functional gates
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reliability and unreliability of circuit
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synthesis of circuits composed of unreliable gates
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fault of type 0
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fault of type \(k-1\)
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