Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements
From MaRDI portal
Publication:1795348
DOI10.3103/S1066369X18050018zbMath1430.94116OpenAlexW2801142483MaRDI QIDQ1795348
O. Yu. Barsukova, M. A. Alekhina
Publication date: 16 October 2018
Published in: Russian Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.3103/s1066369x18050018
reliability and unreliability of circuitsynthesis of circuits composed of unreliable gatesunreliable functional gates\(k\)-valued logics functionfault of type \(k-1\)fault of type 0
Fault detection; testing in circuits and networks (94C12) Analytic circuit theory (94C05) Reliability, testing and fault tolerance of networks and computer systems (68M15)
Related Items
Cites Work
- Reliability of nonbranching programs in an arbitrary complete finite basis
- Sufficient conditions for realizability of Boolean functions by asymptotically optimal circuits with the unreliability \(2\varepsilon \)
- Upper bound of unreliability of circuits in a basis consisting of Webb functions
- Asymptotically optimal reliable circuits in Rosser-Turkett basis (in \(P_k\))
- On reliability of circuits over an arbitrary complete finite basis under single-type constant faults at outputs of elements
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item