On the reliability of circuits that realize the functions of a three-valued logic
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Publication:5264747
zbMATH Open1324.94066MaRDI QIDQ5264747FDOQ5264747
Authors: M. A. Alekhina, O. Yu. Barsukova 
Publication date: 27 July 2015
Full work available at URL: http://mathnet.ru/eng/da781
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Cited In (7)
- Approximate reasoning about logic circuits with single-fan-out unreliable gates
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Upper bound of the circuits unreliability in a complete finite basis (in \(P_3\)) with arbitrary faults of elements
- Complexity of systems of functions of Boolean algebra and systems of functions of three-valued logic in classes of polarized polynomial forms
- Asymptotically optimal in reliability circuits in two bases under failures of \(0\) \((k-1)\) type at the outputs of elements
- Estimations of unreliability of circuits in Rosser-Turkett basis (in \(P_3)\) with faults of type 0 at the outputs of gates
- Asymptotically optimal reliable circuits in Rosser-Turkett basis (in \(P_k\))
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