On the contribution of subinterface microcracks near the tip of an interface macrocrack to the \(J\)-integral in bimaterial solids (Q1388255): Difference between revisions

The \(J\)-integral analysis is performed for the plane problems of multiple subinterface microcracks near the tip of an interface macrocrack in bimaterial solids. The analysis starts from a general solution based on the ``pseudo-traction'' method which has been addressed thoroughly in homogeneous cases. The contribution to the \(J\)-integral induced from an interface macrocrack tip and the remote stress field. Then we develop a new technique to evaluate the second component (being expressed by \(J_2^*\) in this paper) of the well-known \({\mathbf J}_k\)-vector of a subinterface crack for considering a contour enclosing the whole crack, which is necessary to evaluate the contribution to the \(J\)-integral arising from the subinterface microcracks. The consistency of the \(J\)-integral is proved numerical examples, where two kinds of material combinations are considered.