A GLM approach to step-stress accelerated life testing with interval censoring
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Publication:665030
DOI10.1016/j.jspi.2011.09.015zbMath1232.62133OpenAlexW2075767635MaRDI QIDQ665030
Publication date: 5 March 2012
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jspi.2011.09.015
bootstrap methodproportional hazard modelaccelerated life testingWeibull distributiongeneralized linear model
Estimation in multivariate analysis (62H12) Censored data models (62N01) Generalized linear models (logistic models) (62J12) Estimation in survival analysis and censored data (62N02) Reliability and life testing (62N05)
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Cites Work
- A general Bayes exponential inference model for accelerated life testing
- Bootstrap confidence intervals. With comments and a rejoinder by the authors
- Conditions for the coincidence of the TFR, TRV and CE models
- Optimal step-stress test under type I progressive group-censoring with random removals
- A tampered failure rate model for step-stress accelerated life test
- A Semiparametric Model for Regression Analysis of Interval-Censored Failure Time Data
- The Fitting of Exponential, Weibull and Extreme Value Distributions to Complex Censored Survival Data Using GLIM
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Nonparametric standard errors and confidence intervals
- A Proportional Hazards Model for Interval-Censored Failure Time Data
- Analysis of accelerated life tests with weibull failure distribution via generalized linear models
- Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals
- A tampered Brownian motion process model for partial step-stress accelerated life testing