Analysis of accelerated life tests with weibull failure distribution via generalized linear models
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Publication:4844151
DOI10.1080/03610919408813181zbMATH Open0825.62038OpenAlexW2072797979MaRDI QIDQ4844151FDOQ4844151
Emanuel Pimentel Barbosa, Francisco Louzada
Publication date: 20 August 1995
Published in: Communications in Statistics. Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610919408813181
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generalized linear modelsaccelerated life testsWeibull failure distributionstress-response relationship
Cites Work
Cited In (12)
- Generalized Weibull-Lindley (GWL) distribution in modeling lifetime data
- A Bayesian analysis of reliability in accelerated life tests using Gibbs sampler
- Comparing Two Weibull Models with Accelerated Data
- Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
- Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
- GENERALIZED WEIBULL LINEAR MODELS WITH DIFFERENT LINK FUNCTIONS
- An Accelerated Life Test Model Based on Reliability Kinetics
- Estimation for a weibull accelerated life testing model
- A GLM approach to step-stress accelerated life testing with interval censoring
- A new approach for Weibull modeling for reliability life data analysis
- Least Squares estimation for the multivariate weibull model of bougaard based on accelerated life test of system and component
- Time to failure assessment of products at service conditions from accelerated lifetime tests with stress-dependent spread in life
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