Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
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Publication:3747577
DOI10.2307/1269883zbMath0608.62125MaRDI QIDQ3747577
Publication date: 1987
Full work available at URL: https://doi.org/10.2307/1269883
maximum likelihood estimation; Weibull distribution; lognormal; smallest extreme value distribution; time-to-failure distribution; integrated circuit reliability; laboratory life tests; limited failure population
62P30: Applications of statistics in engineering and industry; control charts
62N05: Reliability and life testing
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