Limited Failure Population Life Tests: Application to Integrated Circuit Reliability (Q3747577)
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scientific article; zbMATH DE number 3984413
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Limited Failure Population Life Tests: Application to Integrated Circuit Reliability |
scientific article; zbMATH DE number 3984413 |
Statements
1987
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integrated circuit reliability
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Weibull distribution
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lognormal
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maximum likelihood estimation
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limited failure population
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smallest extreme value distribution
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time-to-failure distribution
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laboratory life tests
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Limited Failure Population Life Tests: Application to Integrated Circuit Reliability (English)
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0.7335601449012756
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0.7267928719520569
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0.7205768823623657
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0.7198706269264221
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0.7101194262504578
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