Continuum modeling of charged vacancy migration in elastic dielectric solids, with application to perovskite thin films
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Publication:1939763
DOI10.1016/j.mechrescom.2007.08.002zbMath1258.74072MaRDI QIDQ1939763
W. D. Nothwang, Michael A. Grinfeld, John D. Clayton, Peter W. Chung
Publication date: 5 March 2013
Published in: Mechanics Research Communications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.mechrescom.2007.08.002
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