A review of accelerated test models (Q2381752)

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A review of accelerated test models
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    title
    A review of accelerated test models (English)
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    author
    Luis A. Escobar
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    William Q. Meeker
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    publication date
    18 September 2007
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    zbMATH DE Number
    5191841
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    zbMATH Keywords
    reliability
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    regression model
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    lifetime data
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    degradation data
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    extrapolation
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    acceleration factor
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    Arrhenius relationship
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    Eyring relationship
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    inverse power relationship
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    voltage-stress acceleration
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    photodegradation
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