Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

DOI10.1016/j.physleta.2004.10.084zbMath1123.81459OpenAlexW2041716445WikidataQ58024944 ScholiaQ58024944MaRDI QIDQ2463340

Yanyan Li

Publication date: 5 December 2007

Published in: Physics Letters. A (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.physleta.2004.10.084

Mathematics Subject Classification ID

Quantum optics (81V80) Lasers, masers, optical bistability, nonlinear optics (78A60)

Related Items (6)

Nanostructures imaging via numerical solution of a 3-D inverse scattering problem without the phase information ⋮ Reconstruction Procedures for Two Inverse Scattering Problems Without the Phase Information ⋮ Uniqueness of a 3-D coefficient inverse scattering problem without the phase information ⋮ A Coefficient Inverse Problem with a Single Measurement of Phaseless Scattering Data ⋮ A phaseless inverse scattering problem for the 3-D Helmholtz equation ⋮ Two reconstruction procedures for a 3D phaseless inverse scattering problem for the generalized Helmholtz equation

This page was built for publication: Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data