Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements

DOI10.1137/08072142XzbMath1180.35561OpenAlexW2005710749WikidataQ59895945 ScholiaQ59895945MaRDI QIDQ3654419

Bastian Harrach, Jin-Keun Seo

Publication date: 6 January 2010

Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1137/08072142x

zbMATH Keywords

inverse problemsfactorization methodelectrical impedance tomographycomplex conductivityfrequency-difference measurements

Mathematics Subject Classification ID

Boundary value problems for second-order elliptic equations (35J25) PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) PDEs with low regular coefficients and/or low regular data (35R05) Numerical methods for inverse problems for boundary value problems involving PDEs (65N21) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

Related Items (13)

The Linearized Inverse Problem in Multifrequency Electrical Impedance Tomography ⋮ Interpolation of missing electrode data in electrical impedance tomography ⋮ Numerical Studies of Recovery Chances for a Simplified EIT Problem ⋮ Nonlinear Fourier analysis for discontinuous conductivities: computational results ⋮ Regularizing a linearized EIT reconstruction method using a sensitivity-based factorization method ⋮ Detecting stochastic inclusions in electrical impedance tomography ⋮ The factorization method for cracks in electrical impedance tomography ⋮ Convergence and regularization for monotonicity-based shape reconstruction in electrical impedance tomography ⋮ Recent progress on the factorization method for electrical impedance tomography ⋮ Expansion Methods ⋮ Sampling Methods ⋮ Computational Framework for Applying Electrical Impedance Tomography to Head Imaging ⋮ Mathematical Modeling of Mechanical Vibration-Assisted Conductivity Imaging

This page was built for publication: Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements