Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements

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Publication:3654419

DOI10.1137/08072142XzbMath1180.35561OpenAlexW2005710749WikidataQ59895945 ScholiaQ59895945MaRDI QIDQ3654419

Bastian Harrach, Jin-Keun Seo

Publication date: 6 January 2010

Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1137/08072142x



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