Limited Failure Population Life Tests: Application to Integrated Circuit Reliability

DOI10.2307/1269883zbMath0608.62125MaRDI QIDQ3747577

William Q. Meeker

Publication date: 1987

Full work available at URL: https://doi.org/10.2307/1269883

zbMATH Keywords

maximum likelihood estimation; Weibull distribution; lognormal; smallest extreme value distribution; time-to-failure distribution; integrated circuit reliability; laboratory life tests; limited failure population

Mathematics Subject Classification ID

62P30: Applications of statistics in engineering and industry; control charts

62N05: Reliability and life testing

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Uses Software

• AS 218