Planning accelerated life tests for censored two-parameter exponential distributions

DOI<169::AID-NAV3>3.0.CO;2-U 10.1002/(SICI)1520-6750(199903)46:2<169::AID-NAV3>3.0.CO;2-UzbMath0918.90079MaRDI QIDQ4239708

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Publication date: 4 August 1999

Full work available at URL: https://doi.org/10.1002/(sici)1520-6750(199903)46:2<169::aid-nav3>3.0.co;2-u

zbMATH Keywords

optimal test plans; optimal accelerated life testing

Mathematics Subject Classification ID

62P30: Applications of statistics in engineering and industry; control charts

90B25: Reliability, availability, maintenance, inspection in operations research

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Cites Work

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• Optimum simple step-stress accelerated life tests with censoring
• Optimum Simple Step-Stress Plans for Accelerated Life Testing
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Optimum simple step-stress accelerated life-tests with competing causes of failure
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
• Designing an optimal life test with type I censoring
• Some Theorems Relevant to Life Testing from an Exponential Distribution