Testability of convergent tree circuits

DOI10.1109/12.536237zbMath1057.68522OpenAlexW2115920077MaRDI QIDQ4420870

John P. Hayes, R. D. Blanton (Shawn)

Publication date: 1996

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.536237

zbMATH Keywords

functional testingiterative logic arrays

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

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