Multivariate SPC Charts for Monitoring Batch Processes

DOI10.2307/1269152zbMath0825.62740OpenAlexW4252531271MaRDI QIDQ4840421

Paul Nomikos, John F. MacGregor

Publication date: 28 November 1995

Full work available at URL: https://doi.org/10.2307/1269152

Mathematics Subject Classification ID

Factor analysis and principal components; correspondence analysis (62H25) Applications of statistics in engineering and industry; control charts (62P30)

Related Items (23)

A comparison study of control charts for statistical monitoring of functional data ⋮ Multidimensional scaling used in multivariate statistical process control ⋮ Fault diagnosis of batch processes using discriminant model ⋮ Direct projection to latent variable space for fault detection ⋮ Fault detection and diagnosis of non-linear non-Gaussian dynamic processes using kernel dynamic independent component analysis ⋮ Fault detection for industrial processes ⋮ A control chart for multivariate Poisson distribution using repetitive sampling ⋮ PLS: A versatile tool for industrial process improvement and optimization ⋮ Batch process monitoring based on multilevel ICA-PCA ⋮ Improved principal component monitoring using the local approach ⋮ Enhanced diagnostics using orthogonal de-noising based nonlinear discriminant analysis and its application to multivariate data ⋮ Using On‐Line Process Data to Improve Quality: Challenges for Statisticians* ⋮ Multivariate Process Monitoring Using the Dynamic Biplot ⋮ Robust PCA for skewed data and its outlier map ⋮ Reconstruction-based contribution for process monitoring ⋮ Estimation of the confidence limits for the quadratic forms in normal variables using a simple Gaussian distribution approximation ⋮ Statistical Perspectives on “Big Data” ⋮ Fault diagnosis for a kind of nonlinear systems by using model-based contribution analysis ⋮ Dynamic VAR model-based control charts for batch process monitoring ⋮ Diagnosing batch processes with insufficient fault data: generation of pseudo batches ⋮ Sensor Fault Detection and Isolation Based on Variable Moving Window KPCA ⋮ Performance assessment and improvement of control charts for statistical batch process monitoring ⋮ Semiconductor chip's quality analysis based on its high dimensional test data

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