Semiconductor chip's quality analysis based on its high dimensional test data

DOI10.1007/S10479-019-03240-ZzbMATH Open1482.62118OpenAlexW2944928547WikidataQ127870993 ScholiaQ127870993MaRDI QIDQ2115804FDOQ2115804

Wu Jin, Sun Kai

Publication date: 21 March 2022

Published in: Annals of Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10479-019-03240-z

zbMATH Keywords

quality controldata processingindustrial electronicsquality-spectrum

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Applications of statistics in engineering and industry; control charts (62P30)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Multivariate SPC Charts for Monitoring Batch Processes
• Spatial quantile estimation of multivariate threshold time series models
• Discussion of ``Influential features PCA for high dimensional clustering

Cited In (1)

• Lifetime performance evaluation and analysis model of passive component capacitor products

This page was built for publication: Semiconductor chip's quality analysis based on its high dimensional test data

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2115804)