Selecting the most reliable design under type-II censored accelerated testing

DOI10.1109/24.249592zbMath0775.62264OpenAlexW2102938451MaRDI QIDQ5288678

Dong Shang Chang, Deng-Yuan Huang, Sheng-Tsaing Tseng

Publication date: 16 August 1993

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.249592

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (5)

Planning accelerated life tests for selecting the most reliable product ⋮ A nonparametric approach for selecting the most reliable population ⋮ Deng–Yuan Huang: Life and Works ⋮ Applying locally optimal criterion for classifying highly-reliable products with a control ⋮ Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes

This page was built for publication: Selecting the most reliable design under type-II censored accelerated testing