A Singular Perturbation Analysis of Reverse Biased $pn$-Junctions (Q3488477)

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A Singular Perturbation Analysis of Reverse Biased $pn$-Junctions
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    title
    A Singular Perturbation Analysis of Reverse Biased $pn$-Junctions (English)
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    DOI
    10.1137/0521017
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    publication date
    1990
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    Mathematics Subject Classification ID
    35B25
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    35R35
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    35J45
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    35M10
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    zbMATH DE Number
    4161175
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    zbMATH Keywords
    drift-diffusion model
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    semiconductor
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