A Singular Perturbation Analysis of Reverse Biased pn-Junctions

DOI10.1137/0521017MaRDI QIDQ3488477zbMATH OpenOpenAlexFDO

Authors Christian Schmeiser

Publication date 1990

Published in SIAM Journal on Mathematical Analysis (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1137/0521017

zbMATH Keywords

drift-diffusion modelsemiconductor

Mathematics Subject Classification ID

Singular perturbations in context of PDEs (35B25) PDEs of mixed type (35M10) Free boundary problems for PDEs (35R35)

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