A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set (Q4571243)
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scientific article; zbMATH DE number 6899416
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set |
scientific article; zbMATH DE number 6899416 |
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A storage-based built-in test pattern generation method for scan circuits based on partitioning and reduction of a precomputed test set (English)
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9 July 2018
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