Electromigration failure of metal lines (Q2432249)

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Electromigration failure of metal lines
scientific article

    Statements

    title
    Electromigration failure of metal lines (English)
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    author
    Hiroyuki Abe
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    K. Sasagawa
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    Masumi Saka
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    publication date
    25 October 2006
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    zbMATH Keywords
    Electromigration
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    failure
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    integrated circuit
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    threshold current density
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    Identifiers

    zbMATH DE Number
    5067147
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    OpenAlex ID
    W4253012649
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