Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition (Q4671324)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition |
scientific article; zbMATH DE number 2161419
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition |
scientific article; zbMATH DE number 2161419 |
Statements
Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition (English)
0 references
26 April 2005
0 references
0 references
