On the Fault Testing for Reversible Circuits (Q5387815)

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scientific article; zbMATH DE number 5279501
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On the Fault Testing for Reversible Circuits
scientific article; zbMATH DE number 5279501

    Statements

    title
    On the Fault Testing for Reversible Circuits (English)
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    author
    Satoshi Tayu
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    Shigeru Ito
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    Shuichi Ueno
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    publication date
    27 May 2008
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    Identifiers

    zbMATH DE Number
    5279501
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    OpenAlex ID
    W1590527680
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