Diagonal Circuit Identity Testing and Lower Bounds (Q3521908)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Diagonal Circuit Identity Testing and Lower Bounds |
scientific article |
Statements
Diagonal Circuit Identity Testing and Lower Bounds (English)
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28 August 2008
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arithmetic circuit
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identity testing
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depth 3
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depth 4
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determinant
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permanent
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lower bounds
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