Improving the quality of meshes for the simulation of semiconductor devices using Lepp‐based algorithms (Q4446788)
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scientific article; zbMATH DE number 2037443
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Improving the quality of meshes for the simulation of semiconductor devices using Lepp‐based algorithms |
scientific article; zbMATH DE number 2037443 |
Statements
Improving the quality of meshes for the simulation of semiconductor devices using Lepp‐based algorithms (English)
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3 February 2004
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Delaunay meshes
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non-obtuse boundary meshes
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Lepp-based algorithms
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control volume method
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semiconductor device simulation
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