Pages that link to "Item:Q2228702"
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The following pages link to An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (Q2228702):
Displaying 6 items.
- Polynomial pattern finding in scattered data (Q507857) (← links)
- Stochastic modeling of random access memories reset transitions (Q1997519) (← links)
- Estimation of the reset voltage in resistive RAMs using the charge-flux domain and a numerical method based on quasi-interpolation and discrete orthogonal polynomials (Q1997630) (← links)
- An efficient smoothness indicator mapped WENO scheme for hyperbolic conservation laws (Q2083890) (← links)
- High order WENO and DG methods for time-dependent convection-dominated PDEs: A brief survey of several recent developments (Q2375251) (← links)
- A spline quasi-interpolation based method to obtain the reset voltage in resistive RAMs in the charge-flux domain (Q2423553) (← links)
