An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (Q2228702)
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scientific article; zbMATH DE number 7313420
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| English | An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors |
scientific article; zbMATH DE number 7313420 |
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An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors (English)
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19 February 2021
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MOSFETs
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threshold voltage extraction
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DIBL effects
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WENO procedure
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0.8319382
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0.80764914
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0.79896486
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